University of Illinois Urbana-Champaign

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Showing 121–150 of 227 items
Thumbnail for CMOS Bridging Fault Simulation
CMOS Bridging Fault Simulation
Greenstein, Gary Stuart

Thumbnail for High-field transport in two-dimensional graphene and molybdenum disulfide
High-field transport in two-dimensional graphene and molybdenum disulfide
Dorgan, Vincent E.

Thumbnail for Investigations of the Electric Field Dependencies of the Generation Rates of Oxide and Interface Traps on Silicon
Investigations of the Electric Field Dependencies of the Generation Rates of Oxide and Interface Traps on Silicon
Nishida, Toshikazu

Thumbnail for Drifting-dipole noise model of nanometer MOSFETs for radio frequency integrated circuit design
Drifting-dipole noise model of nanometer MOSFETs for radio frequency integrated circuit design
Nguyen, Giang D.

Thumbnail for Drifting -Dipole Noise Model of Nanometer MOSFETs for Radio Frequency Integrated Circuit Design
Drifting -Dipole Noise Model of Nanometer MOSFETs for Radio Frequency Integrated Circuit Design
Nguyen, Giang Dong

Thumbnail for Complete electrical study of recombination properties of titanium and zinc deep levels in silicon
Complete electrical study of recombination properties of titanium and zinc deep levels in silicon
Wang, Alex Chikuo

Thumbnail for Hierarchical timing-driven partitioning and placement for symmetrical FPGAs
Hierarchical timing-driven partitioning and placement for symmetrical FPGAs
Karnik, Tanay

Thumbnail for Rule-Based Circuit Optimization for CMOS VLSI
Rule-Based Circuit Optimization for CMOS VLSI
Lai, Feipei

Thumbnail for Toward high-efficiency high power density single-phase DC-AC and AC-DC power conversion - architecture, topology and control
Toward high-efficiency high power density single-phase DC-AC and AC-DC power conversion - architecture, topology and control
Qin, Shibin

Thumbnail for Transport Properties of Chromium - Aluminum Solid Solution Alloys
Transport Properties of Chromium - Aluminum Solid Solution Alloys
Chakrabarti, Dhrubajyoti

Thumbnail for The Summary of Engineering Research 2007
The Summary of Engineering Research 2007
University of Illinois at Urbana-Champaign. College of Engineering

Thumbnail for Low Frequency Noise in Semiconductors and Metals (Statistics, Gaussian (Noise)
Low Frequency Noise in Semiconductors and Metals (Statistics, Gaussian (Noise)
Restle, Phillip John

Thumbnail for Compressed and dynamic fault dictionaries for fault isolation
Compressed and dynamic fault dictionaries for fault isolation
Ryan, Paul George

Thumbnail for Measurement, Modeling, and Simulation of Fast Transients in ESD Devices
Measurement, Modeling, and Simulation of Fast Transients in ESD Devices
Juliano, Patrick Alfred

Thumbnail for The Summary of Engineering Research 2004
The Summary of Engineering Research 2004
University of Illinois at Urbana-Champaign. College of Engineering

Thumbnail for Effects of Depth Variation of Substrate Dopant Impurity Concentration on the Interface Trap Density Determination in Mos Devices (Semiconductor)
Effects of Depth Variation of Substrate Dopant Impurity Concentration on the Interface Trap Density Determination in Mos Devices (Semiconductor)
Pan, Cheng-Sheng

Thumbnail for Distributed timing analysis
Distributed timing analysis
Huang, Tsung-Wei

Thumbnail for Thermally Generated Traps in Boron Implanted Phosphorus Doped Silicon (Semiconductor, Defect)
Thermally Generated Traps in Boron Implanted Phosphorus Doped Silicon (Semiconductor, Defect)
Jackson, Daniel Brian

Thumbnail for Fault-Sensitivity and Wear-Out Analysis of VLSI Systems
Fault-Sensitivity and Wear-Out Analysis of VLSI Systems
Choi, Gwan Seung

Thumbnail for Modeling simulation and design guidelines for EOS/ESD protection circuits in CMOS technologies
Modeling simulation and design guidelines for EOS/ESD protection circuits in CMOS technologies
Ramaswamy, Sridhar

Thumbnail for The Si/SiO2 Interface Roughness
The Si/SiO2 Interface Roughness
Chen, Xidong

Thumbnail for Rigorous Electromagnetic Modeling of Conductor and Substrate Losses for High -Speed Interconnect Structures
Rigorous Electromagnetic Modeling of Conductor and Substrate Losses for High -Speed Interconnect Structures
Coperich, Karen Marie

Thumbnail for Electronic Trapping Properties of Gold Center in Silicon
Electronic Trapping Properties of Gold Center in Silicon
Su, Lu

Thumbnail for Scaling study of phase change memory using carbon nanotube electrodes
Scaling study of phase change memory using carbon nanotube electrodes
Xiong, Feng

Thumbnail for Programmable stochastic processors
Programmable stochastic processors
Sartori, John

Thumbnail for Generation-Annealing of Interface Traps and Hydrogenation of Boron Acceptors in Metal-Oxide-Silicon Capacitors Irradiated by Kilo-Volt Electrons
Generation-Annealing of Interface Traps and Hydrogenation of Boron Acceptors in Metal-Oxide-Silicon Capacitors Irradiated by Kilo-Volt Electrons
Lin, Wallace Wan-Li

Thumbnail for Automatic Bias Generation for Biased Random Instruction Generation
Automatic Bias Generation for Biased Random Instruction Generation
Bose, Mrinal

Thumbnail for Fault sensitivity and wear-out analysis of VLSI systems
Fault sensitivity and wear-out analysis of VLSI systems
Choi, Gwan Seung

Thumbnail for Nonlinear Electro-Thermal Transport in Metallic Carbon Nanotubes
Nonlinear Electro-Thermal Transport in Metallic Carbon Nanotubes
Kuroda, Marcelo

Thumbnail for Computational modeling of laser-induced delamination testing of thin films
Computational modeling of laser-induced delamination testing of thin films
Selvarasu, Premsainath C.