University of Illinois Urbana-Champaign

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Showing 5341–5370 of 12,165 items
Thumbnail for Checking Reachability using Matching Logic
Checking Reachability using Matching Logic
Rosu, Grigore; Stefanescu, Andrei

Thumbnail for Tensor Space Model for Document Analysis
Tensor Space Model for Document Analysis
Cai, Deng; He, Xiaofei; Han, Jiawei

Thumbnail for Field-Directed Sputter Sharpening for Tailored Probe Materials and Atomic-Scale Lithography
Field-Directed Sputter Sharpening for Tailored Probe Materials and Atomic-Scale Lithography
Schmucker, Scott W.; Kumar, Navneet; Abelson, John R.; Daly, Scott R.; Girolami, Gregory S.; Bischof, Maia R.; Jaeger, David L.; Reidy, Rick F.; Gorman, Brian P.; Alexander, Justin; Ballard, Josh B.; Randall, John N.; Lyding, Joseph W.