University of Illinois Urbana-Champaign

Academic Unit
Collection
Author(s)
Keyword(s)
Type of Resource
Showing 91–120 of 1,363 items
Thumbnail for Characterization Of Low Temperature Creep Properties Of Crack Sealants Using Bending Beam Rehometry
Characterization Of Low Temperature Creep Properties Of Crack Sealants Using Bending Beam Rehometry
Al-Qadi, Imad L.; Yang, Shih-Hsien; Elseifi, Mostafa; Dessouky, Samer; Loulizi, Amara; Masson, Jean-François; McGhee, Kevin K.

Thumbnail for The Area Sampling Machine
The Area Sampling Machine
Sung, Hsien Ching Kelvin

Thumbnail for access: v.12, no.01, Spring 1999
access: v.12, no.01, Spring 1999
National Center for Supercomputing Applications (NCSA)