High current pulse characterization of semiconductor devices
Thomson, Nicholas A
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https://hdl.handle.net/2142/89078
Description
Title
High current pulse characterization of semiconductor devices
Author(s)
Thomson, Nicholas A
Issue Date
2015-12-09
Director of Research (if dissertation) or Advisor (if thesis)
Rosenbaum, Elyse
Department of Study
Electrical & Computer Engineering
Discipline
Electrical & Computer Engineering
Degree Granting Institution
University of Illinois at Urbana-Champaign
Degree Name
M.S.
Degree Level
Thesis
Keyword(s)
Electrostatic Discharge (ESD)
Transmission Line-Pulse (TLP)
Abstract
A new ESD testing system, the exponential-edge transmission line pulse system (EETLP), is presented. EETLP generates 100 ns square pulses with a variable, exponentially decaying falling edge. When applied to an ESD protection device, the pulse shape allows for capture of both the transient and quasi-steady-state responses, in the context of a single measurement. EETLP provides unprecedented insight into the turn-off dynamics of snapback-type devices. Device measurement data are presented to demonstrate the capabilities of EETLP.
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