University of Illinois Urbana-Champaign

Designing Radio Frequency Integrated Circuits (RFICs) Based on Low Loss Chip-Scale Lumped Elements

Li, Zijian

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https://hdl.handle.net/2142/88376

Description

Title
Designing Radio Frequency Integrated Circuits (RFICs) Based on Low Loss Chip-Scale Lumped Elements
Author(s)
Li, Zijian
Contributor(s)
Gong, Songbin
Issue Date
2014-12
Keyword(s)
  • RF/microwave filter
  • insertion loss
  • Butterfield filter
Abstract
Over the years the thirst for achieving better filter designs with low insertion loss in RFICs has gradually become unquenchable. Today, cell phones manufactured from different brands all require distinct frequency ranges of the transmitted signal. In order to select the wanted frequencies within a certain range while efficiently rejecting and attenuating the unwanted frequencies outside that range, a band-pass filter is needed. It is imperative to choose the correct prototype of band-pass filter when designing. Typical band-pass filters can be classified into four groups: Butterworth, Chebyshev, Elliptic and Bessel. In this paper, Butterworth filter prototype serves as the main design technique. This thesis revolves around the following general questions that concern the testing, modeling and designing of the band-pass filter: 1. What order of Butterworth filter should be chosen to minimize the insertion loss? 2. What is the difference between ideal reactive components and non-ideal reactive components at high frequencies? 3. Is there an internal relation between Quality Factor, pass band bandwidth and insertion loss? Can this be derived into a closed form equation? 4. What changes should be made when switching from the theoretical simulation to the hands-on PCB board fabrication? 5. Lastly, is there any mismatch between simulation and real measurement? If yes, why are there mismatches and how can they be fixed?
Type of Resource
text
Language
en
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http://hdl.handle.net/2142/88376

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