Lattice Strain Measurements of Deuteride Phase Formation in Epitaxial Niobium on Sapphire
Allain, Monica Marie Cortez
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https://hdl.handle.net/2142/85899
Description
Title
Lattice Strain Measurements of Deuteride Phase Formation in Epitaxial Niobium on Sapphire
Author(s)
Allain, Monica Marie Cortez
Issue Date
2004
Doctoral Committee Chair(s)
Heuser, Brent J.
Department of Study
Nuclear Engineering
Discipline
Nuclear Engineering
Degree Granting Institution
University of Illinois at Urbana-Champaign
Degree Name
Ph.D.
Degree Level
Dissertation
Keyword(s)
Engineering, Materials Science
Language
eng
Abstract
Evidence of significant dislocation formation has been confirmed with high-resolution electron microscopy (HREM) for the 1200A Nb film. The HREM images were used to estimate a dislocation density of 1012 cm-2 after repeated cycling. A residual out-of-plane compressive strain was observed in the 1200A Nb film after complete deuterium evolution. This observation can be explained by irreversible interstitial dislocation loop formation.
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