In Situ Measurement and Modification of the Interface Potential in Hydrogenated Amorphous Silicon Solar Cells
Nuruddin, Ahmad
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https://hdl.handle.net/2142/82877
Description
Title
In Situ Measurement and Modification of the Interface Potential in Hydrogenated Amorphous Silicon Solar Cells
Author(s)
Nuruddin, Ahmad
Issue Date
1997
Doctoral Committee Chair(s)
Abelson, J.R.
Department of Study
Materials Science and Engineering
Discipline
Materials Science and Engineering
Degree Granting Institution
University of Illinois at Urbana-Champaign
Degree Name
Ph.D.
Degree Level
Dissertation
Keyword(s)
Engineering, Materials Science
Language
eng
Abstract
Atomic H treatment leads to ZnO reduction which enhances the potential barrier at ZnO/p$\sp{+}$ a-Si,C:H interface, and lowers the built-in potential in the p$\sp{+}$ layer. Ozone treated ZnO surface reduces the potential barrier, but depletes the surface conductivity. A treatment of atomic H and ozone on ZnO surface improves the ZnO/p$\sp{+}$ a-Si,C:H interface potential, without sacrificing the conductivity of ZnO. As a result, the interface potential barrier reduces from 0.45 to 0.03 Volt, and the built-in potential in the p$\sp{+}$ layer increases $\approx$20 mV. Insertion of $\sim$25 A unhydrogenated p$\sp{+}$ a-Si,C between ZnO/p$\sp{+}$ a-Si,C:H completely eliminates the interface potential barrier. (Abstract shortened by UMI.).
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