Measurement-Based Characterization of Parallel I/O Systems
Sharma, Sanjay
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https://hdl.handle.net/2142/81940
Description
Title
Measurement-Based Characterization of Parallel I/O Systems
Author(s)
Sharma, Sanjay
Issue Date
1999
Doctoral Committee Chair(s)
Iyer, Ravishankar K.
Department of Study
Computer Science
Discipline
Computer Science
Degree Granting Institution
University of Illinois at Urbana-Champaign
Degree Name
Ph.D.
Degree Level
Dissertation
Keyword(s)
Computer Science
Language
eng
Abstract
This research addresses the issue of evaluating the performance of parallel I/O subsystems for a variety of I/O intensive workloads on massively parallel systems. First, a model-based workload specification methodology for generating parallel I/O intensive workloads is described. Second, a synthetic workload generator and a performance measurement and monitoring environment based on the synthetic workload generator is described. Finally, the performances of three different kinds of I/O configurations, based on a client/server model, are characterized on two production class parallel file systems. In light of the measurements obtained on two parallel file systems, possible extensions are suggested to improve the overall architecture as well as the parallel file system of the massively parallel systems.
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