Multiple Design Error Diagnosis and Correction in Digital VLSI Circuits
Veneris, Andreas Georgios
This item is only available for download by members of the University of Illinois community. Students, faculty, and staff at the U of I may log in with your NetID and password to view the item. If you are trying to access an Illinois-restricted dissertation or thesis, you can request a copy through your library's Inter-Library Loan office or purchase a copy directly from ProQuest.
Permalink
https://hdl.handle.net/2142/81937
Description
Title
Multiple Design Error Diagnosis and Correction in Digital VLSI Circuits
Author(s)
Veneris, Andreas Georgios
Issue Date
1998
Doctoral Committee Chair(s)
Hajj, Ibrahim N.
Department of Study
Computer Science
Discipline
Computer Science
Degree Granting Institution
University of Illinois at Urbana-Champaign
Degree Name
Ph.D.
Degree Level
Dissertation
Keyword(s)
Computer Science
Language
eng
Abstract
Our experimental results show that our algorithms have good error resolution and run-time performance as they are able to rectify designs with one, two and three errors within minutes of CPU time. In addition, our experiments suggest that diagnosis and correction of multiple design errors with input test-vector simulation is an attractive alternative to symbolic techniques. This makes our test-vector simulation based methods applicable to designs where a symbolic representation might not be available.
Use this login method if you
don't
have an
@illinois.edu
email address.
(Oops, I do have one)
IDEALS migrated to a new platform on June 23, 2022. If you created
your account prior to this date, you will have to reset your password
using the forgot-password link below.