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https://hdl.handle.net/2142/81363
Description
Title
Temperature -Aware VLSI Design and Analysis
Author(s)
Tsai, Ching-Han
Issue Date
2000
Doctoral Committee Chair(s)
Kang, Sung-Mo (Steve)
Department of Study
Electrical Engineering
Discipline
Electrical Engineering
Degree Granting Institution
University of Illinois at Urbana-Champaign
Degree Name
Ph.D.
Degree Level
Dissertation
Keyword(s)
Engineering, Electronics and Electrical
Language
eng
Abstract
The algorithms and methods developed in this work provide a firm foundation upon which to construct a more effective framework for temperature-sensitive VLSI design and analysis. This work attempts to provide a comprehensive temperature- and reliability-conscious design solution for dealing with emerging thermal and reliability issues.
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