Minority Electron Base Transport in Heterojunction Bipolar Transistors Determined by Magneto-Transport Measurements
Miller, John Gregory
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https://hdl.handle.net/2142/81340
Description
Title
Minority Electron Base Transport in Heterojunction Bipolar Transistors Determined by Magneto-Transport Measurements
Author(s)
Miller, John Gregory
Issue Date
2000
Doctoral Committee Chair(s)
Stillman, Gregory E.
Department of Study
Electrical Engineering
Discipline
Electrical Engineering
Degree Granting Institution
University of Illinois at Urbana-Champaign
Degree Name
Ph.D.
Degree Level
Dissertation
Keyword(s)
Engineering, Electronics and Electrical
Language
eng
Abstract
The magneto-transport method is a technique that allows the simultaneous measurement of the minority electron mobility in the base of the HBT and the dc current gain of the device. The minority electron lifetime can be determined using these two measurements. Therefore, this technique is very valuable for its ability to characterize the quality of the base material in terms of the minority electron's mobility and lifetime. In this dissertation, results performed using the magneto-transport method are used to study the electron mobility and lifetime in HBTs.
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