Efficient Testing for Bridging Faults in Digital Integrated Circuits
Chen, Tzu-Hao
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https://hdl.handle.net/2142/81221
Description
Title
Efficient Testing for Bridging Faults in Digital Integrated Circuits
Author(s)
Chen, Tzu-Hao
Issue Date
1998
Doctoral Committee Chair(s)
Hajj, Ibrahim N.
Department of Study
Electrical Engineering
Discipline
Electrical Engineering
Degree Granting Institution
University of Illinois at Urbana-Champaign
Degree Name
Ph.D.
Degree Level
Dissertation
Keyword(s)
Engineering, Electronics and Electrical
Language
eng
Abstract
Finally, we present a diagnosis test generation method using an adaptive diagnosis scheme. This approach achieves high diagnostic resolution with few required measurements.
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