Simulation- and Deduction-Based Techniques for Fault Diagnosis
Venkataraman, Srikanth
This item is only available for download by members of the University of Illinois community. Students, faculty, and staff at the U of I may log in with your NetID and password to view the item. If you are trying to access an Illinois-restricted dissertation or thesis, you can request a copy through your library's Inter-Library Loan office or purchase a copy directly from ProQuest.
Permalink
https://hdl.handle.net/2142/81219
Description
Title
Simulation- and Deduction-Based Techniques for Fault Diagnosis
Author(s)
Venkataraman, Srikanth
Issue Date
1997
Doctoral Committee Chair(s)
Fuchs, W. Kent
Department of Study
Electrical Engineering
Discipline
Electrical Engineering
Degree Granting Institution
University of Illinois at Urbana-Champaign
Degree Name
Ph.D.
Degree Level
Dissertation
Keyword(s)
Computer Science
Language
eng
Abstract
Finally, an integrated technique that uses a combination of static and dynamic processing for the diagnosis of bridging faults in sequential circuits is presented. During diagnosis, the failing outputs from the test are used to adaptively determine the behavior of the bridge at each time-frame. Selective faulty state information is stored by performing accurate bridging fault simulation once before diagnosis. During diagnosis, the state information is used to increase the accuracy of diagnosis. The combination of adaptive simulation, state storage, and path-tracing has low computational requirements.
Use this login method if you
don't
have an
@illinois.edu
email address.
(Oops, I do have one)
IDEALS migrated to a new platform on June 23, 2022. If you created
your account prior to this date, you will have to reset your password
using the forgot-password link below.
