Parallel Algorithms for Sequential Circuit Fault Simulation and Test Generation
Krishnaswamy, Dilip
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https://hdl.handle.net/2142/81212
Description
Title
Parallel Algorithms for Sequential Circuit Fault Simulation and Test Generation
Author(s)
Krishnaswamy, Dilip
Issue Date
1997
Doctoral Committee Chair(s)
Banerjee, Prithviraj
Janak Patel
Department of Study
Electrical Engineering
Discipline
Electrical Engineering
Degree Granting Institution
University of Illinois at Urbana-Champaign
Degree Name
Ph.D.
Degree Level
Dissertation
Keyword(s)
Mathematics
Language
eng
Abstract
All implementations were done using the MPI communication library and are therefore portable to many parallel platforms. All algorithms provide excellent performance in terms of speedup and quality on both shared-memory and distributed-memory parallel platforms.
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