Sequential Circuit Test Generation Using Genetic Techniques
Hsiao, Michael Shaun
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https://hdl.handle.net/2142/81208
Description
Title
Sequential Circuit Test Generation Using Genetic Techniques
Author(s)
Hsiao, Michael Shaun
Issue Date
1997
Doctoral Committee Chair(s)
Patel, Janak H.
Department of Study
Electrical Engineering
Discipline
Electrical Engineering
Degree Granting Institution
University of Illinois at Urbana-Champaign
Degree Name
Ph.D.
Degree Level
Dissertation
Keyword(s)
Computer Science
Language
eng
Abstract
Finally, synchronizing sequences can greatly benefit test generation. Finding these sequences, however, is nontrivial. The GA is applied to find short synchronizing sequences, and applications of these sequences are also discussed.
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