State Information-Based Solutions for Sequential Circuit Diagnosis and Testing
Boppana, Vamsi
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https://hdl.handle.net/2142/81201
Description
Title
State Information-Based Solutions for Sequential Circuit Diagnosis and Testing
Author(s)
Boppana, Vamsi
Issue Date
1997
Doctoral Committee Chair(s)
Fuchs, W. Kent
Department of Study
Electrical Engineering
Discipline
Electrical Engineering
Degree Granting Institution
University of Illinois at Urbana-Champaign
Degree Name
Ph.D.
Degree Level
Dissertation
Keyword(s)
Computer Science
Language
eng
Abstract
Identifying and understanding the capabilities of sequential untestability identification by practical ATPG algorithms is vital to areas such as ATPG-based optimization and ATPG-based verification. This research provides conditions based on the state properties of the good and the faulty machines involved to ensure that the behavior of the circuit in the presence of untestable faults, as identified by practical sequential ATPG algorithms, is not different from the good circuit. This helps alleviate problems faced with the use of such algorithms in applications where inaccuracies in the identified untestabilities are unacceptable.
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