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https://hdl.handle.net/2142/80998
Description
Title
Interferometric Synthetic Aperture Microscopy
Author(s)
Ralston, Tyler S.
Issue Date
2006
Doctoral Committee Chair(s)
Boppart, Stephen A.
Department of Study
Electrical and Computer Engineering
Discipline
Electrical and Computer Engineering
Degree Granting Institution
University of Illinois at Urbana-Champaign
Degree Name
Ph.D.
Degree Level
Dissertation
Keyword(s)
Engineering, Electronics and Electrical
Language
eng
Abstract
State-of-the-art interferometric microscopies have problems representing objects that lie outside of the focus because the defocus and diffraction effects are not accounted for in the processing. These problems occur because of the lack of comprehensive models to include the scattering effects in the processing. In this dissertation, a new modality in three-dimensional (3D) optical microscopy, Interferometric Synthetic Aperture Microscopy (ISAM), is introduced to account for the scattering effects. Comprehensive models for interferometric microscopy, such as optical coherence tomography (OCT) are developed, for which forward, adjoint, normal, and inverse operators are formulated. Using an accurate model for the probe beam, the resulting algorithms demonstrate accurate linear estimation of the susceptibility of an object from the interferometric data. Using the regularized least squares solution, an ISAM reconstruction of underlying object structure having spatially invariant resolution is obtained from simulated and experimental interferometric data, even in regions outside of the focal plane of the lens. Two-dimensional (2D) and 3D interferometric data is used to resolve objects outside of the confocal region with minimal loss of resolution, unlike in OCT. Therefore, high-resolution details are recovered from outside of the confocal region. Models and solutions are presented for the planar-scanned, the rotationally scanned, and the full-field illuminated geometry. The models and algorithms presented account for the effects of a finite beam width, the source spectrum, the illumination and collection fields, as well as defocus, diffraction and dispersion effects.
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