Ic-Rest(2): A Time-to-Market Driven IC Reliability Statistics Tool
Haggag, Amr
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Permalink
https://hdl.handle.net/2142/80790
Description
Title
Ic-Rest(2): A Time-to-Market Driven IC Reliability Statistics Tool
Author(s)
Haggag, Amr
Issue Date
2002
Doctoral Committee Chair(s)
Hess, Karl
Department of Study
Electrical Engineering
Discipline
Electrical Engineering
Degree Granting Institution
University of Illinois at Urbana-Champaign
Degree Name
Ph.D.
Degree Level
Dissertation
Keyword(s)
Engineering, Electronics and Electrical
Language
eng
Abstract
The tool combines TCAD simulation, short-time tests and novel solutions to the SiO2 and Si-SiO2 defect generation rate equations (in time and space) under static and dynamic operation. The predicted failure statistics are best described by the generalized Gamma-distribution (or more accurately the generalized B-distribution) and on a Gumbel plot look more Weibull than Log-normal .
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