Measurement, Modeling, and Simulation of Fast Transients in ESD Devices
Juliano, Patrick Alfred
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https://hdl.handle.net/2142/80733
Description
Title
Measurement, Modeling, and Simulation of Fast Transients in ESD Devices
Author(s)
Juliano, Patrick Alfred
Issue Date
2001
Doctoral Committee Chair(s)
Rosenbaum, Elyse
Department of Study
Electrical Engineering
Discipline
Electrical Engineering
Degree Granting Institution
University of Illinois at Urbana-Champaign
Degree Name
Ph.D.
Degree Level
Dissertation
Date of Ingest
2015-09-25T20:07:53Z
Keyword(s)
Engineering, Electronics and Electrical
Language
eng
Abstract
We also investigated LVTSCR structures fabricated in a commercial CMOS technology, including measuring the turn-on time of LVTSCR ESD protection devices. A circuit simulation macromodel for use in circuit simulation tools has also been incorporated into the Illinois Electrothermal Simulator (iETSIM). A complete discussion of SCRs as ESD protection devices and our measurement/modeling work is given herein.
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