Measuring the Electronic Structure of Atomically Uniform Silver Films Grown on Silicon Using Angle-Resolved Photoemission Spectroscopy
Speer, Nathan James
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https://hdl.handle.net/2142/80585
Description
Title
Measuring the Electronic Structure of Atomically Uniform Silver Films Grown on Silicon Using Angle-Resolved Photoemission Spectroscopy
Author(s)
Speer, Nathan James
Issue Date
2008
Doctoral Committee Chair(s)
Tai Chiang
Department of Study
Physics
Discipline
Physics
Degree Granting Institution
University of Illinois at Urbana-Champaign
Degree Name
Ph.D.
Degree Level
Dissertation
Keyword(s)
Physics, Condensed Matter
Language
eng
Abstract
As the film thickness increases, the electronic structure evolves to form the bulk band continuum plus separates surfaces states. A careful analysis of this evolution allows us to separate surface from bulk effects, an important and troubling problem in photoemission spectroscopy. As a result, we are able to clearly identify, for the first time, many surface states buried in the pockets of the d-band manifold that had previously only been theoretically predicted.
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