Photoemission Studies of *Interface Effects on Thin Film Properties
Ricci, Dominic A.
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https://hdl.handle.net/2142/80533
Description
Title
Photoemission Studies of *Interface Effects on Thin Film Properties
Author(s)
Ricci, Dominic A.
Issue Date
2006
Doctoral Committee Chair(s)
Chiang, Tai-Chang
Department of Study
Physics
Discipline
Physics
Degree Granting Institution
University of Illinois at Urbana-Champaign
Degree Name
Ph.D.
Degree Level
Dissertation
Keyword(s)
Physics, Condensed Matter
Language
eng
Abstract
Extending the exploration of interfactant effects to physical properties, the thermal stability temperatures of Pb films are measured with photoemission. The quantized electronic structure in Pb films causes the thermal stability to oscillate with an approximate bilayer period. A comparison among the systems reveals a phase reversal and an amplitude deviation in the stability temperatures. For Pb/In- 3 x 3 /Si(111), films made of odd numbers of atomic layers are observed to be more stable than the even ones, but this trend is reversed for the other cases studied. For Pb/Au-6x6/Si(111), the maximum stability temperatures are in excess of room temperature, unlike the other systems. These results show that the temperature-dependent thermal stability behaviors can be controlled by interfacial engineering.
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