Automatic Test Generation Techniques for Sequential Circuits
Yu, Xiaoming
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https://hdl.handle.net/2142/79712
Description
Title
Automatic Test Generation Techniques for Sequential Circuits
Author(s)
Yu, Xiaoming
Issue Date
2002
Doctoral Committee Chair(s)
Elizabeth M. Rudnick
Department of Study
Education
Discipline
Education
Degree Granting Institution
University of Illinois at Urbana-Champaign
Degree Name
Ph.D.
Degree Level
Dissertation
Keyword(s)
Computer Science
Language
eng
Abstract
Finally, a GA-based diagnostic test generation approach is proposed for sequential circuits. A simple GA, which interacts with an efficient diagnostic fault simulator, is proposed to target groups of undistinguished fault pairs iteratively. Efficient data structures are used and heuristics are proposed to seed the initial populations of the GA. Experimental results also demonstrate the efficiency of the proposed method.
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