Optical Spectroscopy Studies of the Reactive Ion Etching of Silicon and Gallium-Arsenide in Halomethane-Based Discharges
Klinger, Robert Edward
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https://hdl.handle.net/2142/71791
Description
Title
Optical Spectroscopy Studies of the Reactive Ion Etching of Silicon and Gallium-Arsenide in Halomethane-Based Discharges
Author(s)
Klinger, Robert Edward
Issue Date
1982
Department of Study
Metallurgy and Mining Engineering
Discipline
Metallurgical Engineering
Degree Granting Institution
University of Illinois at Urbana-Champaign
Degree Name
Ph.D.
Degree Level
Dissertation
Keyword(s)
Engineering, Materials Science
Abstract
The Reactive Ion Etching (RIE) behavior of Si and GaAs in d.c. halomethane-based discharges has been investigated using Glow Discharge Optical Spectroscopy in both emission and absorption modes. The etching of GaAs was found to be anisotropic and a carbon layer formed on the etched surfaces. A post etch in-situ surface analysis technique was developed to measure the functional dependence of etching parameters on the carbon surface layer which forms during RIE. A model was formulated which related the carbon coverage thickness to the fraction of incident halide atoms which actually assist in etching the target material. Using this model one can identify two modes of etching behavior: etchant surface unsaturated and saturated. The RIE of Si is an example of the former, while the RIE of GaAs in fluorinated discharges operates in an etchant saturated mode and proceeds through the ion assisted desorption of otherwise nonvolatile gallium fluoride.
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