University of Illinois Urbana-Champaign

Temperature Noise Reduction Chamber for Laser Diode Testing

Cheu, Xin Loong

This item is only available for download by members of the University of Illinois community. Students, faculty, and staff at the U of I may log in with your NetID and password to view the item. If you are trying to access an Illinois-restricted dissertation or thesis, you can request a copy through your library's Inter-Library Loan office or purchase a copy directly from ProQuest.

Permalink

https://hdl.handle.net/2142/46971

Description

Title
Temperature Noise Reduction Chamber for Laser Diode Testing
Author(s)
Cheu, Xin Loong
Contributor(s)
Goddard, Lynford
Issue Date
2011-05
Keyword(s)
  • diodes
  • lasers
  • laser diodes
  • semiconductor lasers
  • device testing
  • temperature noise reduction
Abstract
Characteristics of semiconductor lasers such as threshold current, quantum efficiency and lasing wavelength are temperature dependent. A typical GaAlAs laser diode shifts 1/4 nm in lasing wavelength with every increase of 1 ºC. Hence, various temperature controllers are built for laser diode testing purposes. This thesis discusses minimizing the temperature noise during testing by reducing the variability of room temperature from ± 1 ºC to 10‐7 ºC in a copper chamber. First, the temperature variability is reduced by 10‐3 using an LDT‐5980 ILX Lightwave temperature controller. The remaining 10‐4 is further achieved by buffering the heat flux of the controller with an insulator. A high sensitivity thermistor, coupled with a wheatstone bridge circuit, is utilized to read the controlled temperature with high precision.
Type of Resource
text
Language
en
Permalink
http://hdl.handle.net/2142/46971

Owning Collections

Senior Theses - Electrical and Computer Engineering PRIMARY
The best of ECE undergraduate research