Thermal Radiation Measurements of Graphene for Temperature Extraction
Shine, Gautam
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https://hdl.handle.net/2142/46967
Description
Title
Thermal Radiation Measurements of Graphene for Temperature Extraction
Author(s)
Shine, Gautam
Contributor(s)
Pop, Eric
Goddard, Lynford
Issue Date
2011-05
Keyword(s)
graphene
thermal radiation
device modeling
Abstract
Graphene is a two-dimensional carbon crystal arranged in a honeycomb lattice.
Its excellent electronic properties and planar geometry make it a viable candidate
for nanoelectronic applications. In this study, large-area (0.25 mm2) graphene
grown by chemical vapor deposition on a 90 nm SiO2 substrate was put under
high bias. The resulting thermal radiation was measured in different infrared
wavelength ranges. By comparing the amount of radiation in various bands, an
approximate temperature of the emitting source can be determined due to the
uniqueness of the blackbody profile at each temperature. Integrated radiation at
different biases may also be compared to determine temperature if one temperature
is known. These extracted temperatures are compared with the expected
temperature calculated using a model based on thermal resistances.
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