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https://hdl.handle.net/2142/46481
Description
Title
Raman Spectroscopy Of Defective Graphene
Author(s)
Neumann, Christopher A.
Contributor(s)
Pop, Eric
Issue Date
2012-12
Keyword(s)
spectroscopy
Raman spectroscopy
Raman scattering
graphene
defective graphene
Abstract
Raman spectroscopy has proven to be an invaluable tool for researchers looking to better characterize graphene and related materials, such as carbon nanotubes. Prior work has demonstrated a linear relationship between temperature and position of the G and G’ Raman peaks. However, little work has been done to investigate the D peak, which corresponds to defects in the lattice. In this work we examined defective graphene samples fabricated via chemical vapor deposition (CVD) using a Renishaw inVia Raman microscope and a temperature controlled stage. From this, we find that the peak shift due to temperature of the G’ peak is approximately twice that of the D peak. The temperature dependence of the D peak could be used to measure heat dissipation in the vicinity of defects and edges of graphene devices.
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