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https://hdl.handle.net/2142/46481
Description
Title
Raman Spectroscopy Of Defective Graphene
Author(s)
Neumann, Christopher A.
Contributor(s)
Pop, Eric
Issue Date
2012-12
Keyword(s)
spectroscopy
Raman spectroscopy
Raman scattering
graphene
defective graphene
Date of Ingest
2014-01-09T15:23:26Z
Abstract
Raman spectroscopy has proven to be an invaluable tool for researchers looking to better characterize graphene and related materials, such as carbon nanotubes. Prior work has demonstrated a linear relationship between temperature and position of the G and G’ Raman peaks. However, little work has been done to investigate the D peak, which corresponds to defects in the lattice. In this work we examined defective graphene samples fabricated via chemical vapor deposition (CVD) using a Renishaw inVia Raman microscope and a temperature controlled stage. From this, we find that the peak shift due to temperature of the G’ peak is approximately twice that of the D peak. The temperature dependence of the D peak could be used to measure heat dissipation in the vicinity of defects and edges of graphene devices.
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