Determination of the CTE tensor of materials from high temperature X-ray diffraction
Jones, Zachary
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https://hdl.handle.net/2142/42211
Description
Title
Determination of the CTE tensor of materials from high temperature X-ray diffraction
Author(s)
Jones, Zachary
Issue Date
2013-02-03T19:28:01Z
Director of Research (if dissertation) or Advisor (if thesis)
Kriven, Waltraud M.
Department of Study
Materials Science & Engineerng
Discipline
Materials Science & Engr
Degree Granting Institution
University of Illinois at Urbana-Champaign
Degree Name
M.S.
Degree Level
Thesis
Keyword(s)
Thermal Expansion
X-ray Diffraction
Abstract
Thermal expansion is historically reported as an average coefficient to estimate the change in dimensions of a material as it is heated or cooled. This average works well for approximating thermal expansion in high-symmetry crystals, but for low-symmetry crystals (monoclinic, triclinic), anisotropy in a system shows a deviation from averages. The Coefficient of Thermal Expansion Analysis Suite (CTEAS) has been developed to calculate and visualize thermal expansion properties of crystalline materials in three dimensions. The software can be used to determine the independent terms of the second rank thermal expansion tensor using hkl values, corresponding d-hkl listings, and lattice constants obtained from powder XRD patterns collected at different temperatures. Using CTEAS, a researcher can also visualize the anisotropy of this essential material property in three dimensions. In depth understanding of the thermal expansion of crystalline materials can be a useful tool in understanding the thermal properties of materials with temperature when correlated with the crystal structure.
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