Surface stress and reversing size effect in the initial yielding of ultrathin films
Gioia, Gustavo; Dai, Xiangyu
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https://hdl.handle.net/2142/327
Description
Title
Surface stress and reversing size effect in the initial yielding of ultrathin films
Author(s)
Gioia, Gustavo
Dai, Xiangyu
Issue Date
2005-08
Date of Ingest
2007-03-09T20:33:50Z
Abstract
Very recent experiments indicate that in free-standing metallic films of constant grain size the initial yield stress increases as the film becomes thinner, it peaks for a thickness on the order of 100 nm, and then starts to decrease. This reversing size effect poses two challenges: (1) It cannot be explained using currently available models and (2) it appears to contradict the classical experimental results due to J. W. Beams. Here we show that the reversing size effect can be explained and the contradiction dispelled by taking into account how the initial yielding is affected by the surface stress. We also predict that the mode of failure of a film changes from ductile to brittle for a thickness on the order of 100 nm, in accord with experiments.
Publisher
Department of Theoretical and Applied Mechanics (UIUC)
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