3D Electro-thermal Monte Carlo Study of Transport in confined Silicon Devices
Mohamed, Mohamed
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https://hdl.handle.net/2142/31963
Description
Title
3D Electro-thermal Monte Carlo Study of Transport in confined Silicon Devices
Author(s)
Mohamed, Mohamed
Issue Date
2012-06-27T21:21:44Z
Director of Research (if dissertation) or Advisor (if thesis)
Ravaioli, Umberto
Doctoral Committee Chair(s)
Ravaioli, Umberto
Choquette, Kent D.
Tucker, John R.
Jain, Kanti
Department of Study
Electrical & Computer Eng
Discipline
Electrical & Computer Engr
Degree Granting Institution
University of Illinois at Urbana-Champaign
Degree Name
Ph.D.
Degree Level
Dissertation
Keyword(s)
Monte Carlo
Multigate
Self-heating
Phonon transport
Electron transport
Short-channel Effects
Quantum correction
Multi-subband
Abstract
The simultaneous explosion of portable microelectronics devices and the rapid shrinking of microprocessor size have provided a tremendous motivation to scientists and engineers to continue the down-scaling of these devices. For several decades, innovations have allowed components such as transistors to be physically reduced in size, allowing the famous Moore's law to hold true. As these transistors approach the atomic scale, however, further reduction becomes less probable and practical. As new technologies overcome these limitations, they face new, unexpected problems, including the ability to accurately simulate and predict the behavior of these devices, and to manage the heat they generate.
This work uses a 3D Monte Carlo (MC) simulator to investigate the electro-thermal behavior of quasi-one-dimensional electron gas (1DEG) multigate MOSFETs. In order to study these highly confined architectures, the inclusion of quantum correction becomes essential. To better capture the influence of carrier confinement, the electrostatically quantum-corrected full-band MC model has the added feature of being able to incorporate subband scattering. The scattering rate selection introduces quantum correction into carrier movement.
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