University of Illinois Urbana-Champaign

In situ X-ray diffraction study of electric field induced domain switching and phase transition in PZT-5H

Liu, Ming; Hsia, K. Jimmy; Sardela, Mauro, Jr.

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https://hdl.handle.net/2142/294

Description

Title
In situ X-ray diffraction study of electric field induced domain switching and phase transition in PZT-5H
Author(s)
  • Liu, Ming
  • Hsia, K. Jimmy
  • Sardela, Mauro, Jr.
Issue Date
2003-05
Keyword(s)
  • experimental solid mechanics
  • fracture
  • micromechanics
  • plasticity
Abstract
In-situ x-ray experiments were conducted to examine the electric-field-induced phase changes in PZT-5H materials. The x-ray diffraction profiles at different electric field levels were analyzed by peak fitting and used to identify the occurrence of non-180° domain switching and phase transition. We found that, in depolarized samples, there exists a threshold electric field for the phase changes; whereas in polarized samples, no such threshold exists. The profound difference in the diffraction profile changes under positive and negative electric fields in polarized samples is responsible for the asymmetry of piezoelectric effects. Peak fitting results show composition and transition of phases as well as domain switching at different electric field levels. These observations further indicate the importance of residual stresses in materials behaviors.
Publisher
Department of Theoretical and Applied Mechanics (UIUC)
Series/Report Name or Number
TAM Reports 1026
ISSN
0073-5264
Type of Resource
text
Language
en
Permalink
http://hdl.handle.net/2142/294

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Technical Reports - Theoretical and Applied Mechanics (TAM) PRIMARY
TAM technical reports include manuscripts intended for publication, theses judged to have general interest, notes prepared for short courses, symposia compiled from outstanding undergraduate projects, and reports prepared for research-sponsoring agencies.