University of Illinois Urbana-Champaign

The effect of point defects in copper on the anomalous transmission of X-rays

Edelheit, Lewis Selig

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Description

Title
The effect of point defects in copper on the anomalous transmission of X-rays
Author(s)
Edelheit, Lewis Selig
Issue Date
1970
Doctoral Committee Chair(s)
Koehler, James S.
Department of Study
Physics
Discipline
Physics
Degree Name
Ph.D.
Degree Level
Dissertation
Keyword(s)
  • point defects
  • copper
  • anomalous x-ray transmission
  • Borrmann measurements
Language
en
Abstract
Anomalous X-ray transmission (Borrmann) measurements were made at 4.2 K on nearly perfect copper single crystals before and after irradiation at 20 K with 3 MeV electrons (total integrated flux 0.B7 X 101B electrons/em2). The intensity in the diffracted direction was measured for the (111), (222), (333), and (220) reflecting planes. The measured intensity changes were 1.15 t ,4%, 4.52 ± .6%, 8.90 ± .8%, and 4.06 + .8% respectively. A comparison of the observed intensity changes with theoretical predictions, assuming that the damage consists of isolated interstitials and vacancies, and using previously calculated displacements associated with these defects, indicates that the interstitial is not in the split (100) configuration. Possible configurations are the body centered interstitial or the split (111) interstitial. Measurements after annealing at BOoK and 3000K were made. The measurements indicated that defect clusters were formed when the irradiated crystal was heated to 80oK, and some clusters remained after annealing at room temperature.
Type of Resource
text
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http://hdl.handle.net/2142/25806
Copyright and License Information
1970 Lewis Selig Edelheit

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