Techniques to speedup test generation for VLSI circuits
Chandra, Susheel Jagdish
This item is only available for download by members of the University of Illinois community. Students, faculty, and staff at the U of I may log in with your NetID and password to view the item. If you are trying to access an Illinois-restricted dissertation or thesis, you can request a copy through your library's Inter-Library Loan office or purchase a copy directly from ProQuest.
Permalink
https://hdl.handle.net/2142/21314
Description
Title
Techniques to speedup test generation for VLSI circuits
Author(s)
Chandra, Susheel Jagdish
Issue Date
1989
Doctoral Committee Chair(s)
Patel, Janak H.
Department of Study
Electrical and Computer Engineering
Discipline
Electrical Engineering
Degree Granting Institution
University of Illinois at Urbana-Champaign
Degree Name
Ph.D.
Degree Level
Dissertation
Keyword(s)
Engineering, Electronics and Electrical
Computer Science
Language
eng
Abstract
The increasing complexity of logic circuits has made the problem of test generation intractable. In this dissertation we investigate three different techniques to speed up the test generation process. The first approach attempts to exploit the hierarchy inherent in any complex digital design. An intermediate high-level representation is proposed, and algorithms to perform forward implication and backtracing in the proposed framework are developed. Results of test generation experiments based on this approach are also presented.
The second technique deals with the use of heuristics in test generation algorithms. Based on an extensive study of five existing testability measures, a composite test generation strategy is evaluated. The composite strategy uses multiple testability measures to aid the test generation guidance heuristic. Our results indicate that this strategy not only gives better fault coverage but also reduces the average time taken per fault.
Finally we investigate the viability of parallel processing for test generation. Schemes for mapping test generation algorithms onto different classes of parallel machines are presented. The performance of these mapping strategies is predicted based on uniprocessor turnaround times and an estimate of the communication delays.
Use this login method if you
don't
have an
@illinois.edu
email address.
(Oops, I do have one)
IDEALS migrated to a new platform on June 23, 2022. If you created
your account prior to this date, you will have to reset your password
using the forgot-password link below.
