Characterization and Engineering of Error Statistics for Reliable Computation
Lee, Yu-Hung
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https://hdl.handle.net/2142/18281
Description
Title
Characterization and Engineering of Error Statistics for Reliable Computation
Author(s)
Lee, Yu-Hung
Issue Date
2011-01-14T22:44:30Z
Director of Research (if dissertation) or Advisor (if thesis)
Shanbhag, Naresh R.
Department of Study
Electrical & Computer Eng
Discipline
Electrical & Computer Engr
Degree Granting Institution
University of Illinois at Urbana-Champaign
Degree Name
M.S.
Degree Level
Thesis
Keyword(s)
robust system design
error statistics
diversity technique
error model
Abstract
We make a case for developing statistical error models of nanoscale circuits, employing these for designing robust systems, and engineering
error-statistics to enhance the performance of various robust design techniques. A simple additive error model is presented for arithmetic computations. The proposed error model is shown to be a strong function of the architecture, and a weak function of the
input statistics, thus enabling a one-time off-line characterization similar to delay and power characterization done presently. In addition, we propose architectural diversity and scheduling diversity to engineer the occurrence of independent errors as required by robust system design techniques such as soft N-modular redundancy (NMR). Finally, we employ error statistics to develop soft dual-MR (DMR) and triple-MR (TMR) techniques for the adder operation and the filter design. All quantitative results are demonstrated in a commercial 45 nm CMOS process.
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