Atomic force microscope cantilever with reduced second harmonic frequency during tip-surface contact
Felts, Jonathan
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https://hdl.handle.net/2142/14660
Description
Title
Atomic force microscope cantilever with reduced second harmonic frequency during tip-surface contact
Author(s)
Felts, Jonathan
Issue Date
2010-01-06T16:20:43Z
Director of Research (if dissertation) or Advisor (if thesis)
King, William P.
Doctoral Committee Chair(s)
King, William P.
Department of Study
Mechanical Sci & Engineering
Discipline
Mechanical Engineering
Degree Granting Institution
University of Illinois at Urbana-Champaign
Degree Name
M.S.
Degree Level
Thesis
Keyword(s)
Atomic Force Microscope
micro cantilever
harmonic frequency
mode shapes
Abstract
We describe an atomic force microscope cantilever design for which the second flexural mode frequency can be tailored relative to the first mode frequency, for operation in contact with a substrate. A freely-resonating paddle internal to the cantilever reduces the stiffness of the second flexural mode relative to the first while nearly maintaining the mass of the original cantilever. This strategy allows the ratio of the first two resonant modes f2/f1 to be controlled over the range 1.6 – 4.5. The ability to vary f2/f1 could improve a variety of dynamic contact-mode measurements.
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