I. A New Technique of X-Ray Microradiography. II. Quantitative Evaluation of Crystalline Distortion and Fatigue by X-Ray Diffraction

Shafer, William McKinley

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https://hdl.handle.net/2142/123598

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Title: I. A New Technique of X-Ray Microradiography. II. Quantitative Evaluation of Crystalline Distortion and Fatigue by X-Ray Diffraction
Author(s): Shafer, William McKinley
Issue Date: 1940
Department of Study: Physics
Degree Granting Institution: University of Illinois at Urbana-Champaign
Degree Name: Ph.D. (doctoral)
Degree Level: Dissertation
Keyword(s): Radiography
Language: eng
Type of Resource: text

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