Chip Seal Quality Assurance Using Percent Embedment

Alhasan, Ahmad; Moon, Brian; Steele, Doug; Lee, Hyung; Sufian, Abu Ahmed

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https://hdl.handle.net/2142/121577 Copy

Description

Title

Chip Seal Quality Assurance Using Percent Embedment

Author(s)

• Alhasan, Ahmad
• Moon, Brian
• Steele, Doug
• Lee, Hyung
• Sufian, Abu Ahmed

Issue Date

2023-12

Keyword(s)

• Chip Seal
• Percent Embedment
• Quality Assurance
• Macrotexture
• Laser Texture Scanning
• Image Analysis

Abstract

This study investigates the use of macrotexture as an indicator of the percent embedment (PE) of aggregate in a chip seal and ultimately, as a quality assurance tool for chip seals. The study included an extensive field- and controlled-testing program from 24 chip seal sections constructed in Illinois. Surface texture measurements were acquired using a high-speed texture profiler and a stationary laser texture device. The analysis showed that stationary texture measurements were more consistent and reliable for estimating PE and characterizing chip seals in the field. Moreover, the ground truth PE values were estimated using an image analysis algorithm implemented on side-view images of cores extracted in the field. The ground truth PE values were estimated using four approaches: the average elevation method, percent embedment of each aggregate method, the peak method, and the aggregate circumference method. The analysis showed that the correlations between the different PE estimation methods are relatively weak, indicating the various methods provide different information and may relate to different characteristics. The general regression models for PE values estimated using the average elevation method and the mean profile depth (MPD) acquired using laser texture scans and the average least dimension (ALD) yielded the highest R2 value of 0.50. The model showed a consistent decreasing trend between PE and MPD estimated using laser texture scans and side-view images. Moreover, the model matched the expected behavior that PE should reach 100% as MPD reaches 0. Finally, four models were recommended correlating PE estimated using the average elevation and each aggregate methods to the MPD (mm) estimated from laser texture scans and ALD (mm) estimated from side-view images.

Publisher

Illinois Center for Transportation/Illinois Department of Transportation

Has Part

• https://doi.org/10.36501/0197-9191/23-029
• ISSN: 0197-9191

Series/Report Name or Number

FHWA-ICT-23-022

Type of Resource

text

Language

en

Sponsor(s)/Grant Number(s)

IDOT-R27-221

Copyright and License Information

No restrictions. This document is available through the National Technical Information Service, Springfield, VA 22161.

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