Dissociation breakup of doubly ionized n2o induced by 38.5 ev photons

Ma, Xinwen

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https://hdl.handle.net/2142/107647 Copy

Description

Title

Dissociation breakup of doubly ionized n2o induced by 38.5 ev photons

Author(s)

Ma, Xinwen

Contributor(s)

• Zhang, Shaofeng
• Dong, Dapu
• Lei, Jianting
• Zhao, Dongmei
• Najjari, Bennaceur
• Hai, Bang
• Zhang, Min

Issue Date

2020-06-24

Keyword(s)

Small molecules

Abstract

The dissociation mechanism of N$_{2}$O$^{2+}$ has been investigated experimentally after double ionization by a single EUV photon with an energy of 38.5 eV using reaction microscope. From the ion-ion time-of-flight coincidence spectrum, the de-nitrogenation (N$_{2}$O$^{2+}$ $\rightarrow$ N$^{+}$ + NO$^{+}$) and de-oxygenation (N$_{2}$O$^{2+}$ $\rightarrow$ O$^{+}$ + N$_{2}^{+}$) channel of N$_{2}$O$^{2+}$ are identified. It is found that, after removal of two electrons, the N$_{2}$O$^{2+}$ dications are mainly promoted to the 1$^{1}\Delta$ and 1$^{1}\Sigma^{+}$ states for de-nitrogenation channel. In its KER spectra, a main peak centered at 6.4 eV with a shoulder towards higher energies is observed. The major peak is derived from the direct dissociation of N$_{2}$O$^{2+}$ from the 1$^{1}\Delta$ and 1$^{1}\Sigma^{+}$ potential curve to the N$^{+}$($^{1}$D) + NO$^{+}$($^{1}\Sigma^{+}$) (second dissociation limit L2). The shoulder is originated from the dissociation of N$_{2}$O$^{2+}$ from the 1$^{1}\Delta$ and 1$^{1}\Sigma^{+}$ states to the N$^{+}$($^{3}$P) + NO$^{+}$($^{1}\Sigma^{+}$) (first dissociation limit L1) via the crossing of 1$^{3}\Pi$ state in the potential energy curves. In addition, the relative contributions from each dissociating processes are obtained for de-nitrogenation channel. Our work shows that the table-top monochromatic EUV beam line provides great advantages in detailed studies of the electronic states and dissociation dynamics.

Publisher

International Symposium on Molecular Spectroscopy

Type of Resource

Text

Language

eng

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http://hdl.handle.net/2142/107647

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Copyright 2020 is held by the Author(s)

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