High-resolution infrared spectra and analyses of SiF4

Boudon, Vincent

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https://hdl.handle.net/2142/104572 Copy

Description

Title

High-resolution infrared spectra and analyses of SiF4

Author(s)

Boudon, Vincent

Contributor(s)

Manceron, Laurent

Issue Date

2019-06-21

Keyword(s)

Atmospheric science

Abstract

\begin{wrapfigure}{r}{0pt} \includegraphics[scale=0.2]{Fig_nu3.eps} \end{wrapfigure} Volcanoes reject large amounts of sulfur-containing gases in the atmosphere; these represent 10 to 15~\% of the anthropogenic sulfur emissions. Thermodynamic considerations show that silicon tetrafluoride (SiF$_4$) should be a normal trace component of volcanic gases. Some studies report that the possible importance of SiF$_4$ had been neglected because of the problems of reporting HF and SiF$_4$ separately in conventional analyses. However, a better knowledge of spectroscopic parameters is needed for this molecule in order to derive accurate concentrations. This is why we undertook an extensive high-resolution study of its infrared absorption bands, including the fundamentals and several overtone and combinations. We present here a detailed analysis and modeling of the strongly absorbing $\nu_3$ fundamental, for the there isotopplogues in natural abundance: ${}^{28}$SiF$_4$ (92.23~\%), ${}^{29}$SiF$_4$ (4.67~\%) and ${}^{30}$SiF$_4$ (3.10~\%). Progresses in the analysis of the other bands will be outlined.

Publisher

International Symposium on Molecular Spectroscopy

Type of Resource

text

Language

eng

Permalink

http://hdl.handle.net/2142/104572

DOI

https://doi.org/10.15278/isms.2019.FB08

Copyright and License Information

Copyright 2019 Vincent Boudon

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