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Design, modeling and fabrication of contact stiffness calibration samples for CR-AFM
Chen, Sihan
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https://hdl.handle.net/2142/105279
Description
- Title
- Design, modeling and fabrication of contact stiffness calibration samples for CR-AFM
- Author(s)
- Chen, Sihan
- Issue Date
- 2015-07-20
- Director of Research (if dissertation) or Advisor (if thesis)
- King, William P.
- Department of Study
- Mechanical Sci & Engineering
- Discipline
- Mechanical Engineering
- Degree Granting Institution
- University of Illinois at Urbana-Champaign
- Degree Name
- M.S.
- Degree Level
- Thesis
- Date of Ingest
- 2019-08-23T20:48:28Z
- Keyword(s)
- contact stiffness
- AFM
- calibration
- Abstract
- This thesis presents a method to experimentally calibrate the contact stiffness of an atomic force microscope (AFM) cantilever tip in contact with a surface, which is a critical step in the measurement of nano-mechanical properties. The calibration exploits the relationship between contact resonance (CR) frequency and contact stiffness during contact resonance atomic force microscopy (CR-AFM). We present design, modeling, fabrication and characterization of a novel calibration sample, which consists of a series of rigid copper disks of varying diameter on top of a soft PDMS substrate. Larger disks produce larger contact stiffness, so a range of known contact stiffness is achieved with a range of metal disk sizes.
- Graduation Semester
- 2015-08
- Type of Resource
- text
- Permalink
- http://hdl.handle.net/2142/105279
- Copyright and License Information
- Copyright 2015 by Sihan Chen. All rights reserved.
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Graduate Dissertations and Theses at Illinois PRIMARY
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