Optical Measurement of Liquid Film Thickness and Wave Velocity in Liquid Film Flows

Hurlburt, E.T.; Newell, T.A.

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https://hdl.handle.net/2142/11117 Copy

Description

Title

Optical Measurement of Liquid Film Thickness and Wave Velocity in Liquid Film Flows

Author(s)

• Hurlburt, E.T.
• Newell, T.A.

Issue Date

1995-09

Keyword(s)

• two-phase modeling
• annular flow regimes
• stratified flow regimes

Abstract

Two optical techniques are described for measurement of a liquid film's surface. Both techniques make use of the total internal reflection which occurs at a liquid-vapor interface due to the refractive index difference between a liquid and a vapor. The fIrst technique is used for film thickness determination. A video camera records the distance between a light source and the rays which are reflected back from the liquid-vapor interface. This distance can be shown to be linearly proportional to film thickness. The second technique measures surface wave velocities. Two photosensors, spaced a fIxed distance apart, are used to record the time varying intensity of light reflected from the liquid-vapor interface. The velocity is then deduced from the time lag between the two signals.

Publisher

Air Conditioning and Refrigeration Center. College of Engineering. University of Illinois at Urbana-Champaign.

Series/Report Name or Number

Air Conditioning and Refrigeration Center TR-85

Type of Resource

text

Language

en

Permalink

http://hdl.handle.net/2142/11117

Sponsor(s)/Grant Number(s)

Air Conditioning and Refrigeration Center Project 45

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