University of Illinois Urbana-Champaign

Optical Measurement of Liquid Film Thickness and Wave Velocity in Liquid Film Flows

Hurlburt, E.T.; Newell, T.A.

Content Files
TR085.pdf

Permalink

https://hdl.handle.net/2142/11117

Description

Title
Optical Measurement of Liquid Film Thickness and Wave Velocity in Liquid Film Flows
Author(s)
  • Hurlburt, E.T.
  • Newell, T.A.
Issue Date
1995-09
Keyword(s)
  • two-phase modeling
  • annular flow regimes
  • stratified flow regimes
Date of Ingest
2009-04-20T18:31:53Z
Abstract
Two optical techniques are described for measurement of a liquid film's surface. Both techniques make use of the total internal reflection which occurs at a liquid-vapor interface due to the refractive index difference between a liquid and a vapor. The fIrst technique is used for film thickness determination. A video camera records the distance between a light source and the rays which are reflected back from the liquid-vapor interface. This distance can be shown to be linearly proportional to film thickness. The second technique measures surface wave velocities. Two photosensors, spaced a fIxed distance apart, are used to record the time varying intensity of light reflected from the liquid-vapor interface. The velocity is then deduced from the time lag between the two signals.
Publisher
Air Conditioning and Refrigeration Center. College of Engineering. University of Illinois at Urbana-Champaign.
Series/Report Name or Number
Air Conditioning and Refrigeration Center TR-85
Type of Resource
text
Genre of Resource
Technical Report
Language
en
Permalink
http://hdl.handle.net/2142/11117
Sponsor(s)/Grant Number(s)
Air Conditioning and Refrigeration Center Project 45

Owning Collections

Technical Reports - Air Conditioning and Refrigeration Center PRIMARY