Design Automation for Reliable CMOS Chip I/O Circuits

Li, Tong

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https://hdl.handle.net/2142/103927 Copy

Description

Title

Design Automation for Reliable CMOS Chip I/O Circuits

Author(s)

Li, Tong

Issue Date

1998-08

Keyword(s)

• Design automation
• CMOS circuits
• VLSI
• Electrostatic discharge (ESD)
• Reliability

Publisher

Coordinated Science Laboratory, University of Illinois at Urbana-Champaign

Series/Report Name or Number

Coordinated Science Laboratory Report no. UILU-ENG-98-2219, DAC-66

Type of Resource

text

Language

en

Permalink

http://hdl.handle.net/2142/103927

Sponsor(s)/Grant Number(s)

Joint Services Electronics Program / N00014-90-J-1270, 98-DJ-613, F30602-94-1-0006

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