Efficient Testing for Bridging Faults in Digital Integrated Circuits

Chen, Tzu-Hao

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https://hdl.handle.net/2142/103917 Copy

Description

Title

Efficient Testing for Bridging Faults in Digital Integrated Circuits

Author(s)

Chen, Tzu-Hao

Issue Date

1997-12

Keyword(s)

• Bridging fault
• Fault extraction
• Fault simulation
• Test generation
• Diagnosis

Publisher

Coordinated Science Laboratory, University of Illinois at Urbana-Champaign

Series/Report Name or Number

Coordinated Science Laboratory Report no. UILU-ENG-97-2236, DAC-62

Type of Resource

text

Language

en

Permalink

http://hdl.handle.net/2142/103917

Sponsor(s)/Grant Number(s)

SRC

Owning Collections