Investigating soft failures induced by system-level ESD
Vora, Sandeep Gautam
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https://hdl.handle.net/2142/102509
Description
Title
Investigating soft failures induced by system-level ESD
Author(s)
Vora, Sandeep Gautam
Issue Date
2018-12-11
Director of Research (if dissertation) or Advisor (if thesis)
Rosenbaum, Elyse
Department of Study
Electrical & Computer Eng
Discipline
Electrical & Computer Engr
Degree Granting Institution
University of Illinois at Urbana-Champaign
Degree Name
M.S.
Degree Level
Thesis
Keyword(s)
ESD
Soft Failures
System-Level ESD
IEC 61000-4-2
Soft Failure
Abstract
Hardware and application-level manifestations of ESD soft failures were characterized for three single-board computers. ESD events were generated following the system-level ESD standard (IEC 61000-4-2), matching real-world testing and events. Soft failures resulting from ESD were seen on all products tested. Failures associated with the peripheral ICs occur independently of the application being run; the application-dependent failures are attributed to noise at the CPU.
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