The Use of Hierarchy in Test Generation, Fault Simulation, and Testability Analysis Algorithms
Rogers, William Arthur
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https://hdl.handle.net/2142/88600
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Title The Use of Hierarchy in Test Generation, Fault Simulation, and Testability Analysis Algorithms Author(s) Rogers, William Arthur Issue Date 1988-01 Keyword(s) Digital circuit design Fault simulation Automatic test pattern generation Hierarchy in test generation Testability analysis algorithms Publisher Coordinated Science Laboratory, University of Illinois at Urbana-Champaign Series/Report Name or Number Coordinated Science Laboratory Report no. UILU-ENG-88-2205, CSG-80 Type of Resource text Language en Permalink http://hdl.handle.net/2142/88600 Sponsor(s)/Grant Number(s) SRC Hewlett-Packard Semiconductor Research Corporation (including SRC member companies Hewlett-Packard and General Electric) / SRC 87-DP-109
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