A Comprehensive Fault Model for Concurrent Error Detection in MOS Circuits

Halperin, Daniel Lee

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https://hdl.handle.net/2142/88584 Copy

Description

Title

A Comprehensive Fault Model for Concurrent Error Detection in MOS Circuits

Author(s)

Halperin, Daniel Lee

Issue Date

1983-12

Keyword(s)

• Concurrent error detection
• Fault models
• Indeterminate faults
• MOS circuits
• Physical failure modes
• Separable codes
• Ternary algebra
• Totally self-checking circuits

Publisher

Computer Systems Group, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign

Series/Report Name or Number

Coordinated Science Laboratory Report no. CSG-25

Type of Resource

text

Language

en

Permalink

http://hdl.handle.net/2142/88584

Sponsor(s)/Grant Number(s)

Naval Electronics Sys. Comm. and Office of Naval Research / N00039-80-C-0556

Owning Collections