Fault-Sensitivity and Wear-Out Analysis of VLSI Systems

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https://hdl.handle.net/2142/88487

Title: Fault-Sensitivity and Wear-Out Analysis of VLSI Systems
Author(s): Choi, Gwan Seung
Issue Date: 1995-06
Publisher: Center for Reliable and High-Performance Computing, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign
Series/Report Name or Number: Coordinated Science Laboratory Report no. UILU-ENG-95-2218, CRHC-95-14
Type of Resource: text
Language: en
Permalink: http://hdl.handle.net/2142/88487
Sponsor(s)/Grant Number(s): Joint Services Electronics Program, National Aeronautics & Space Administration, and Office of Naval Research; NASA NAG 1-613 and N00014-90-J-1270