Probabilistic Simulation for Reliability Analysis of VLSI Circuits

Najm, Farid Nasri

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https://hdl.handle.net/2142/88615 Copy

Description

Title

Probabilistic Simulation for Reliability Analysis of VLSI Circuits

Author(s)

Najm, Farid Nasri

Issue Date

1989-08

Keyword(s)

• Probabilistic simulation
• Reliability
• Electromigration
• Stochastic analysis
• VLSI CMOS circuits
• Pattern-independent analysis

Publisher

Coordinated Science Laboratory, University of Illinois at Urbana-Champaign

Series/Report Name or Number

Coordinated Science Laboratory Report no. UILU-ENG-89-2221, DAC-14

Type of Resource

text

Language

en

Permalink

http://hdl.handle.net/2142/88615

Sponsor(s)/Grant Number(s)

• Texas Instruments
• U.S. Rome Air Development Center (RADC)

Owning Collections