Computationally Efficient Methods for Accurate Timing and Reliability Simulation of Ultra-Large MOS Circuits

Shih, Yung-Ho

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https://hdl.handle.net/2142/88622 Copy

Description

Title

Computationally Efficient Methods for Accurate Timing and Reliability Simulation of Ultra-Large MOS Circuits

Author(s)

Shih, Yung-Ho

Issue Date

1991-07

Keyword(s)

• Circuit simulation
• Timing simulation
• Reliability simulation
• Waveform relaxation

Publisher

Analog and Digital Circuits, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign

Series/Report Name or Number

Coordinated Science Laboratory Report no. UILU-ENG-91-2235, DAC-27

Type of Resource

text

Language

en

Permalink

http://hdl.handle.net/2142/88622

Sponsor(s)/Grant Number(s)

Joint Services Electronics Program / N00014-90-J-1270

Owning Collections