University of Illinois Urbana-Champaign

Switching Density Analysis for Power and Reliability in VLSI Circuits

Hill, Anthony Martin

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https://hdl.handle.net/2142/88632

Description

Title
Switching Density Analysis for Power and Reliability in VLSI Circuits
Author(s)
Hill, Anthony Martin
Issue Date
1995-12
Keyword(s)
  • Power estimation
  • IC reliability
  • Switching density
  • Maximum power
  • Short-circuit power
Publisher
Analog and Digital Circuits, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign
Series/Report Name or Number
Coordinated Science Laboratory Report no. UILU-ENG-95-2240, DAC-53
Type of Resource
text
Language
en
Permalink
http://hdl.handle.net/2142/88632
Sponsor(s)/Grant Number(s)
  • Joint Services Electronics Program / N00014-90-J-1270
  • National Science Foundation graduate research fellowship

Owning Collections

Report - Coordinated Science Laboratory PRIMARY