Techniques for Automatic Test Knowledge Extraction from Compiled Circuits

Thearling, Kurt Henry

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https://hdl.handle.net/2142/88636 Copy

Description

Title

Techniques for Automatic Test Knowledge Extraction from Compiled Circuits

Author(s)

Thearling, Kurt Henry

Issue Date

1990-08

Keyword(s)

• Knowledge extraction
• High-level synthesis
• Testability
• Circuit partitioning

Publisher

Center for Reliable and High-Performance Computing, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign

Series/Report Name or Number

Coordinated Science Laboratory Report no. UILU-ENG-90-2234, CRHC-90-4

Type of Resource

text

Language

en

Permalink

http://hdl.handle.net/2142/88636

Sponsor(s)/Grant Number(s)

General Electric

Owning Collections